Possibility of mapping a complex of optical lunar characteristics

Details Possibility of mapping a complex of optical lunar characteristics Possibility of mapping a complex of optical lunar characteristics

Apr 1975

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1975azh....52..398e&link_type=abstract

Astronomicheskii Zhurnal, vol. 52, Mar.-Apr. 1975, p. 398-403. In Russian.

Astronomy and Astrophysics

Astronomy

Astronomical Photometry, Lunar Maps, Optical Properties, Selenography, Surface Properties, Brightness, Lunar Photography, Lunar Surface, Polarization Characteristics

Scientific paper

It is shown that details of the lunar surface can be mapped by photographic photometry using reflection and polarization functions. A method is described whereby a system of isolines can be obtained which delineates variations in such optical characteristics as normal albedo, color index, brightness phase gradient, degree of polarization, and polarization index. It is noted that maps of these optical characteristics may be used for photometric studies of the moon and physical mapping of the lunar surface.

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