Stray radiation IV; Proceedings of the Meeting, San Diego, CA, August 23, 1984

Details Stray radiation IV; Proceedings of the Meeting, San Diego, CA, August 23, 1984 Stray radiation IV; Proceedings of the Meeting, San Diego, CA, August 23, 1984

Jan 1984

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1984spie..511.....b&link_type=abstract

Meeting sponsored by SPIE - The International Society for Optical Engineering. Bellingham, WA, SPIE - The International Society

Astronomy and Astrophysics

Astronomy

Conferences, Light Scattering, Antireflection Coatings, Diffraction, Infrared Astronomy, Infrared Scanners, Infrared Telescopes, Interferometry, Scatterometers, Surface Roughness

Scientific paper

Studies related to the theory and the principles of stray light are discussed, taking into account a comparison of roughness measurements by differential scatter and total integrated scatter, image degradation caused by direct scatter from optical components into the image plane, deviations associated with vector perturbation diffraction theory, and statistical effects in the measurement and characterization of smooth scattering surfaces. Aspects of surface scatter and measurements are explored, giving attention to the effects of atomic oxygen on Martin Black and Infrablack, relative micro-roughness scattering from the surfaces of a transmitting optical element, a new instrument for constant (beta - beta-0) scatter mapping of contiguous optical surfaces of up to 25 square inches, and the scattering of baffle vane edges. Subjects concerned with the stray light analysis of systems are also explored, and the analysis of stray light variations in IR scanning systems by computer modeling is considered.

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