Low-light-level performance of a TI 800 X 800 CCD

Details Low-light-level performance of a TI 800 X 800 CCD Low-light-level performance of a TI 800 X 800 CCD

Sep 1988

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1988pasp..100.1162l&link_type=abstract

Astronomical Society of the Pacific, Publications (ISSN 0004-6280), vol. 100, Sept. 1988, p. 1162-1168.

Astronomy and Astrophysics

Astronomy

1

Charge Coupled Devices, Charge Transfer Devices, Photometers, Transmission Efficiency, Accuracy, Electromagnetic Noise, Quantum Efficiency, Sensitivity

Scientific paper

The behavior of a thinned 800 X 800 CCD for use in low-light-level detection programs in optical astronomy is discussed with respect to charge-transfer efficiency, noise statistics, quantum efficiency, and charge loss effects. It is found that charge transfer in the horizontal direction below the one-electron level is good. In the vertical direction, charge transfer deteriorates below three electrons. Down to a level of two electrons per pixel, image noise is attributable to the sum of readout noise and Poisson counting noise. It is shown that the quantum efficiency is independent of light level over a range of 0.6 to 400 electrons. Leakage effects on a time scale of four hours at a count level of 82 electrons per pixel are found to be less than 0.11 electron per pixel per hour.

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