NICMOS Transfer Function Verification Test

Details NICMOS Transfer Function Verification Test NICMOS Transfer Function Verification Test

Dec 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997hst..prop.7037s&link_type=abstract

HST Proposal ID #7037

Computer Science

Hst Proposal Id #7037

Scientific paper

The purpose of this test is to verify the basic operating
characteristics of the NICMOS FPAs. This will be accomplished by taking
a series of dark frames at different detector vias voltages {0.0-0.6V in
0.1V steps}. These should be taken in parallel as the data will be
directly compared with ground {System Functional} test data.

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