In situ measurement of the sub-pixel structure in ACIS CCDs

Details In situ measurement of the sub-pixel structure in ACIS CCDs In situ measurement of the sub-pixel structure in ACIS CCDs

Apr 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999head....4.1721p&link_type=abstract

American Astronomical Society, HEAD meeting #4, #17.21; Bulletin of the American Astronomical Society, Vol. 31, p.720

Astronomy and Astrophysics

Astronomy

Scientific paper

As part of our calibration of ACIS, the AXAF CCD Imaging Spectrometer, we have refined a technique that uses a thin metal film with small, periodically spaced holes to restrict incident photons to well-defined regions of the pixel, providing a way to probe sub-pixel structure. Studying the sub-pixel structure of CCDs is crucial for accurately modeling their absolute detection efficiency and for understanding the structure present in their spectral redistribution function. These experiments also demonstrate the ability to resolve source location on sub-pixel scales, which holds promise for fully utilizing the spatial resolution capabilities of Chandra with ACIS.

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