Atomic force microscopy imaging of ALH84001 fragments

Details Atomic force microscopy imaging of ALH84001 fragments Atomic force microscopy imaging of ALH84001 fragments

Mar 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997lpi....28.1369s&link_type=abstract

Conference Paper, 28th Annual Lunar and Planetary Science Conference, p. 369.

Computer Science

1

Mars Surface, Meteoritic Composition, Atomic Force Microscopy, Fragments, Carbonates, Organisms, Globules, X Ray Analysis, Biogeny

Scientific paper

Atomic force microscopy (AFM) is used to examine fragments of ALH84001 in order to image microfossil structures at high resolution and without sample pretreatment. It is shown that the AFM can image fragments of ALH84001 at nanometer resolutions. EDX mapping of the fragment surface enable the AFM to image the different phases of the carbonate globules down to nanometer resolutions.

Affiliated with

Also associated with

No associations

Rating

Atomic force microscopy imaging of ALH84001 fragments does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Atomic force microscopy imaging of ALH84001 fragments, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Atomic force microscopy imaging of ALH84001 fragments will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-874207