Performance tests of large CCDs

Details Performance tests of large CCDs Performance tests of large CCDs

Jul 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1447..214r&link_type=abstract

Proc. SPIE Vol. 1447, p. 214-228, Charge-Coupled Devices and Solid State Optical Sensors II, Morley M. Blouke; Ed.

Astronomy and Astrophysics

Astronomy

3

Scientific paper

Results obtained in fabricating and testing of large CCD image sensors are reported. The emphasis is on high quantum efficiency, excellent charge transfer efficiency at low signal level, large pixel count, low readout noise, and very low dark current. The focus is on the use of the devices for optical astronomy where these parameters are most important. Test results for CCDs fabricated by Ford Aerospace and by EG&G Reticon are presented. Experiments to demonstrate the feasibility of a reproducible biased-gate using transparent indium tin oxide as a conducting layer over a silicon oxide insulating layer are discussed. Quantum efficiency of bias-gate thinned CCDs is compared with results obtained from a phosphor-coated front- illuminated CCD.

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