New approach to the study of microchannel plate sensitive surface

Details New approach to the study of microchannel plate sensitive surface New approach to the study of microchannel plate sensitive surface

Nov 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1344..210g&link_type=abstract

IN: EUV, X-ray, and Gamma-ray instrumentation for astronomy; Proceedings of the Meeting, San Diego, CA, July 11-13, 1990 (A92-20

Astronomy and Astrophysics

Astronomy

Mass Spectroscopy, Microchannel Plates, Time Of Flight Spectrometers, Extreme Ultraviolet Radiation, Image Intensifiers, X Ray Astronomy

Scientific paper

A new approach to study the composition of microchannel plate sensitive surface by secondary ion mass spectrometry is described. The time-of-flight technique is implemented in an unconventional way which permits using the continuous probing beam and concurrent multichannel mass identification. This makes the technique relatively simple, and the low doses and low probing beam intensities provide the opportunity to perform nondestructive analysis of thin layers and fragile films.

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