Sample Characterization on Asteroid Sample Return Missions by the Alpha X-Ray Spectrometer

Details Sample Characterization on Asteroid Sample Return Missions by the Alpha X-Ray Spectrometer Sample Characterization on Asteroid Sample Return Missions by the Alpha X-Ray Spectrometer

Jan 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000neas.work...10e&link_type=abstract

Near-Earth Asteroid Sample Return Workshop, p. 10

Computer Science

Asteroids, Chemical Composition, Spectrometers, In Situ Measurement, Asteroid Missions

Scientific paper

Probably one of the most important tasks on any asteroid mission is to determine the detailed chemical composition of the asteroid. While this task can be best achieved by detailed analyses of returned asteroid samples by a variety of techniques in the terrestrial laboratories, much can be learned about asteroids from in-situ investigations conducted from the orbit and on the asteroid surface. During the rendezvous period the orbiter could perform many investigations from orbit to globally characterize the asteroid and document the surface environment. A lander on such missions could perform in-situ investigations or collect samples to bring back to Earth. In order to bring back the right samples it will be necessary to bring along tools to properly characterize the collected samples. One of such tool could be the recently developed Alpha X-ray Spectrometer (AXS) that could fulfill both these requirements. Additional information is contained in the original extended abstract.

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