Polarimetry with a soft x-ray spectrometer

Details Polarimetry with a soft x-ray spectrometer Polarimetry with a soft x-ray spectrometer

2008-09-17

arxiv.org/abs/0809.2928v1

Astronomy and Astrophysics

Astrophysics

Accepted for publication in the proceedings of the SPIE, volume 7011

Scientific paper

10.1117/12.787249

An approach for measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics is described. A set of multilayer-coated flats reflect the dispersed X-rays to the instrument detectors. The intensity variation as a function of energy and position angle is measured to determine three Stokes parameters: I, Q, and U. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors over 80% over the entire 0.2 to 0.8 keV band. A sample design is shown that could be used with a small orbiting mission.

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