Rule-based Test Generation with Mind Maps

Details Rule-based Test Generation with Mind Maps Rule-based Test Generation with Mind Maps

2012-02-28

arxiv.org/abs/1202.6125v1

EPTCS 80, 2012, pp. 103-114

Computer Science

Software Engineering

In Proceedings MBT 2012, arXiv:1202.5826

Scientific paper

10.4204/EPTCS.80.8

This paper introduces basic concepts of rule based test generation with mind maps, and reports experiences learned from industrial application of this technique in the domain of smart card testing by Giesecke & Devrient GmbH over the last years. It describes the formalization of test selection criteria used by our test generator, our test generation architecture and test generation framework.

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