Simultaneous EUV and X-ray variability of NGC 4051

Details Simultaneous EUV and X-ray variability of NGC 4051 Simultaneous EUV and X-ray variability of NGC 4051

1999-12-06

arxiv.org/abs/astro-ph/9912103v1

Astronomy and Astrophysics

Astrophysics

8 pages, accepted for publication in MNRAS

Scientific paper

10.1046/j.1365-8711.2000.03266.x

We present a flux variability study of simultaneous RXTE and EUVE observations of the highly variable Seyfert galaxy NGC4051. We find a strong correlation between variability in the EUV and medium energy X-ray bands,indicating that both are sampling the same power-law continuum. The lag between the two bands is less than 20 ks and, depending on model assumptions, may be <1 ks. We examine the consequences of such a small lag in the context of simple Comptonisation models for the production of the power-law continuum. A lag of <1 ks implies that the size of the Comptonising region is less than 20 Schwarzschild radii for a black hole of mass >1E6 solar masses.

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