Level Crossing Rate and Average Fade Duration of the Double Nakagami-m Random Process and Application in MIMO Keyhole Fading Channels

Details Level Crossing Rate and Average Fade Duration of the Double Nakagami-m Random Process and Application in MIMO Keyhole Fading Channels Level Crossing Rate and Average Fade Duration of the Double Nakagami-m Random Process and Application in MIMO Keyhole Fading Channels

2009-08-25

arxiv.org/abs/0908.3541v1

IEEE Communications Letters, Volume 12, Issue 11, November 2008 Page(s):822 - 824

Computer Science

Information Theory

Scientific paper

10.1109/LCOMM.2008.081058

We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are then used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations.

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