Effects of space radiation on electronic microcircuits

Details Effects of space radiation on electronic microcircuits Effects of space radiation on electronic microcircuits

May 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989seem.work..383k&link_type=abstract

In NASA, Langley Research Center, NASA/SDIO Space Environmental Effects on Materials Workshop, Part 2 p 383-392 (SEE N89-23547 1

Other

Aerospace Environments, Extraterrestrial Radiation, Integrated Circuits, Latch-Up, Microelectronics, Single Event Upsets, Charged Particles, Cumulative Damage, Galactic Cosmic Rays, Radiation Belts, Radiation Damage, Solar Flares

Scientific paper

The single event effects or phenomena (SEP), which so far have been observed as events falling on one or another of the SE classes: Single Event Upset (SEU), Single Event Latchup (SEL) and Single Event Burnout (SEB), are examined. Single event upset is defined as a lasting, reversible change in the state of a multistable (usually bistable) electronic circuit such as a flip-flop or latch. In a computer memory, SEUs manifest themselves as unexplained bit flips. Since latchup is in general caused by a single event of short duration, the single event part of the SEL term is superfluous. Nevertheless, it is used customarily to differentiate latchup due to a single heavy charged particle striking a sensitive cell from more ordinary kinds of latchup. Single event burnout (SEB) refers usually to total instantaneous failure of a power FET when struck by a single particle, with the device shorting out the power supply. An unforeseen failure of these kinds can be catastrophic to a space mission, and the possibilities are discussed.

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