Long range effects of gain depression in microchannel plates

Details Long range effects of gain depression in microchannel plates Long range effects of gain depression in microchannel plates

Oct 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992spie.1743..283e&link_type=abstract

In: EUV, X-ray, and gamma-ray instrumentation for astronomy III; Proceedings of the Meeting, San Diego, CA, July 22-24, 1992 (A9

Astronomy and Astrophysics

Astronomy

Amplification, Microchannel Plates, Porous Materials, Losses, Point Sources, Regression Analysis

Scientific paper

It has been found that the gain depression in MCPs operated at high gains is a relatively long range phenomenon. Active pores can significantly depress the gain in the surrounding quiescent pores at distances of the order of millimeters. This is of fundamental importance for detectors in which high point source count rates are encountered. We have measured this effect for a variety of plate operating conditions and point source count rates and find that in all cases there is a constant limiting radius. We have also determined that the gain depression has a long term effect on the MCP.

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