Detailed Depth-Profiling of Presolar SiC Grains

Details Detailed Depth-Profiling of Presolar SiC Grains Detailed Depth-Profiling of Presolar SiC Grains

Mar 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007lpi....38.2145k&link_type=abstract

38th Lunar and Planetary Science Conference, (Lunar and Planetary Science XXXVIII), held March 12-16, 2007 in League City, Texas

Computer Science

1

Scientific paper

We are undertaking comprehensive, all-element analyses of presolar SiC
grains by high resolution TOFSIMS depth profiling. This abstract looks
at some experimental artifacts that limit the resolution and accuracy of
data that can be obtained.

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