Nanoscale PtSi Tips for Conducting Probe Technologies

Details Nanoscale PtSi Tips for Conducting Probe Technologies Nanoscale PtSi Tips for Conducting Probe Technologies

Jan 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009itnan...8..128b&link_type=abstract

IEEE Transactions on Nanotechnology, vol. 8, issue 1, pp. 128-131

Computer Science

5

Conducting Afm, Conducting Probes, Ptsi Tips

Scientific paper

A method to improve the conduction and wear properties of nanometric conducting tips by forming silicides of Pt at the tip apex is presented. Tips with PtSi apexes are fabricated in conjunction with standard Si tips. Wear measurements are carried out on both tip types of similar geometries, and a one-on-one comparison between Si and PtSi at the nanoscale is shown for the first time. Both the wear properties on tetrahedral amorphous carbon and the conduction on Au of the PtSi tip apexes are shown to be superior to the Si tips.

Affiliated with

Also associated with

No associations

Rating

Nanoscale PtSi Tips for Conducting Probe Technologies does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Nanoscale PtSi Tips for Conducting Probe Technologies, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nanoscale PtSi Tips for Conducting Probe Technologies will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1809556