Evaluation of the total dose and single event upset effects on JPEG/DPCM LSI device and 16Mb-DRAM for space application

Details Evaluation of the total dose and single event upset effects on JPEG/DPCM LSI device and 16Mb-DRAM for space application Evaluation of the total dose and single event upset effects on JPEG/DPCM LSI device and 16Mb-DRAM for space application

Nov 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2804..185t&link_type=abstract

Proc. SPIE Vol. 2804, p. 185-193, Missions to the Sun, David M. Rust; Ed.

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Recently many satellites have missions to transmit image data to the ground through realtime downlink. Since the satellites are linked to the ground stations through limited bandwidth, the image data must be compressed to meet mission requirements. Meanwhile, the Institute of Space and Astronautical Science and other public establishments have begun to appropriate commercially available devices to their projects to reduce development costs and to apply the latest technologies. Under these circumstances, we evaluated the radiation tolerance characteristics of a large scale integrated (LSI) device having both the JPEG (lossy) and DPCM (lossless) functions and a large scale integrated dynamic random access memory (16 Mb-DRAM) necessary to carry out the compression. To gather the radiation tolerance characteristics, we carried out the single event upset tolerance test and total dose tolerance test for JPEG/DPCM LSI and 16 Mb-DRAM. In this paper, using the data gathered from the radiation tests, we describe the feasibility of applying JPEG/DPCM LSI and 16 Mb-DRAM to satellites.

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