Soft x-ray resonant magnetic scattering study of thin films and multilayers

Details Soft x-ray resonant magnetic scattering study of thin films and multilayers Soft x-ray resonant magnetic scattering study of thin films and multilayers

Nov 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1548..149k&link_type=abstract

Proc. SPIE Vol. 1548, p. 149-157, Production and Analysis of Polarized X Rays, D. P. Siddons; Ed.

Computer Science

Scientific paper

A brief review of using soft x-ray resonant magnetic scattering in the study of magnetic thin films and multilayers is given. Results from recent studies of thin Fe films and Fe/Gd multilayers are used as examples to demonstrate the information that can be obtained and the unique features of this technique. Comparison is made with related techniques: magneto- optical Kerr effect, Faraday effect, and magnetic circular dichroism.

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