Computer Science
Scientific paper
Mar 1993
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993spie.1782..238p&link_type=abstract
Proc. SPIE Vol. 1782, p. 238-244, Thin Films for Optical Systems, Karl H. Guenther; Ed.
Computer Science
Scientific paper
The thickness uniformity of vacuum deposited layers is a very important parameter for optical coatings. We have developed a computer program for the calculation of the uniformity as a function of the vapor distribution for planetary systems. This program shows the existence of a configuration such as the uniformity is practically independent of the vapor distribution. We give the example of an experimental system for processing four substrates of 300 mm diameter with a uniformity better than +/- 0.3% in a 1 m3 box coater.
Gailliard Jean-Pierre
Perrin Aime
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