Ion characteristics to the 667.82 nm He I spectral line shape

Details Ion characteristics to the 667.82 nm He I spectral line shape Ion characteristics to the 667.82 nm He I spectral line shape

Jul 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002pobeo..73..167m&link_type=abstract

Publications of the Astronomical Observatory of Belgrade (ISSN 0373-3742), No. 73, p. 167 - 172 (2002). In: Proceedings of the T

Astronomy and Astrophysics

Astronomy

Spectral Lines, Helium

Scientific paper

Ion characteristics of the 667.82nm He I spectral line profiles have been investigated at electron densities between 4.4×1022 and 8.2×1022m-3 and electron temperatures between 18000 and 33000K in plasmas created in five various discharge conditions using a linear, low-pressure, pulsed arc as an optically thin plasma source operated in a helium-nitrogen-oxygen gas mixture. On the basis of the observed asymmetry of the line profiles we have obtained their ion broadening parameters (A) caused by influence of the ion microfield on the line broadening mechanism and also the influence of the ion dynamic effect (D) on the line shape. Our A and D parameters represent the first data obtained experimentally by the use of the line profile deconvolution procedure. We have found stronger influence of the ion contribution to this He I line profile than the semiclassical theoretical approximation provides.

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