Dark Signal Characterization of 1.7 micron cutoff devices for SNAP

Details Dark Signal Characterization of 1.7 micron cutoff devices for SNAP Dark Signal Characterization of 1.7 micron cutoff devices for SNAP

Dec 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004aas...205.6606s&link_type=abstract

American Astronomical Society Meeting 205, #66.06; Bulletin of the American Astronomical Society, Vol. 36, p.1456

Astronomy and Astrophysics

Astronomy

Scientific paper

We report initial progress characterizing non-photometric sources of error -- dark current, noise, and zero point drift -- for 1.7 micron cutoff HgCdTe and InGaAs detectors under development by Raytheon, Rockwell, and Sensors Unlimited for SNAP. Dark current specifications can already be met with several detector types. Changes to the manufacturing process are being explored to improve the noise reduction available through multiple sampling. In some cases, a significant number of pixels suffer from popcorn noise, with a few percent of all pixels exhibiting a ten fold noise increase. A careful study of zero point drifts is also under way, since these errors can dominate dark current, and may contribute to the noise degradation seen in long exposures.

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