High-resolution measurements in the EUV on NSTX

Astronomy and Astrophysics – Astrophysics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Scientific paper

The extreme ultraviolet (EUV) wavelength band is rich in lines useful as plasma diagnostics. This fact is being used by the Chandra and XMM-Newton satellites for studying stellar coronae and galactic nuclei. We have installed a new grating spectrometer on the NSTX tokamak that allows us to study emission lines in the EUV with similar spectral resolution. We have observed the K-shell lines of heliumlike and hydrogenlike boron, carbon, and oxygen. Moreover, we have measured the L-shell spectra of neonlike Ar, Fe, and Ni. All elements except argon were intrinsic to NSTX plasmas. Many of these spectra are of great interest to astrophysics. Our measurements provide line lists and calibrate density-sensitive line ratios in a density regime not accessible by other laboratory sources. Moreover, we were able to measure the temperature dependence of several iron lines needed to address puzzling results from stellar flare plasmas. This work was performed under the auspices of the U.S. DOE by UC-LLNL under contract W-7405-Eng-48 and by PPPL under contract DE-AC02-76CHO3073.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

High-resolution measurements in the EUV on NSTX does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with High-resolution measurements in the EUV on NSTX, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High-resolution measurements in the EUV on NSTX will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1620228

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.