Keck long-wavelength spectrometer

Astronomy and Astrophysics – Astronomy

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

52

Scientific paper

UCSD's IR astronomy group is building an imaging mid-IR spectrometer for the Keck Telescope. This instrument, the Long-Wavelength Spectrometer (LWS), is built around a 96 X 96 element, Si:As impurity band conduction array built by GenCorp Aerojet Electronics Systems Division. The LWS has low and moderate spectroscopy modes with nominal spectral resolutions of R (equals (lambda) /(Delta) (lambda) ) equals 100 and 1400 respectively, operating in the 10 micrometers (second order) and 20 micrometers (first order) ground- based atmospheric spectral windows. The LWS is also capable of direct imaging from 5 micrometers to 27 micrometers through a selection of 16 filters. For each of the spectroscopic modes and the direct imaging mode, the plate scale is 0.12 arcsec/pixel, which Nyquist samples the telescope's diffraction pattern at 10 micrometers . Because of the large light gathering power of the Keck Telescope and it's small diffraction pattern, the LWS will have unparalleled point source sensitivity, making it the premiere instrument for extragalactic and general faint-source mid-IR spectroscopy.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Keck long-wavelength spectrometer does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Keck long-wavelength spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Keck long-wavelength spectrometer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1572870

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.