New event analysis method with the x-ray CCD camera XIS for ASTRO-E

Details New event analysis method with the x-ray CCD camera XIS for ASTRO-E New event analysis method with the x-ray CCD camera XIS for ASTRO-E

Oct 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999spie.3765..160m&link_type=abstract

Proc. SPIE Vol. 3765, p. 160-170, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, Oswald H. Siegmund; Kathryn A. Flan

Astronomy and Astrophysics

Astronomy

Scientific paper

We introduce a new method of event analysis with the x-ray CCD camera (XIS) on board the next Japanese X-ray astronomical satellite, Astro-E. In the ordinary method, we used 'grade' classification; we distinguished the x-ray events from background events by referring the shape and the extent of the charge-split pixels, because non x-ray events spread to many pixels. However, at the same time, this method lowered the quantum efficiency of high energy x-ray photons which also extend for several pixels. We tried the method with 2D image-fitting of each event. We succeeded in rejecting non x-ray events by the extent of fitted function. We achieved higher detection efficiency by 10 percent than the grade method for hard x-rays above 8 keV, while the energy resolution becomes worse by 0-8 percent. The improvements and the problems of this new method are also presented.

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