An intensity/linewidth analysis of opacity: first applications to a solar prominence and HeII line profiles

Astronomy and Astrophysics – Astronomy

Scientific paper

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Line: Profiles, Sun: Atmosphere, Sun: Prominences, Ultraviolet: Stars

Scientific paper

An analysis is described which can derive optical thicknesses and associated quantities from measured intensities and linewidths using convenient expressions for photon escape probabilities and for opacity-broadened line halfwidths. An associated analysis of the effect of observational errors is provided. The analysis treats intensities and linewidths independently so that internal consistency of results can provide a measure of observational accuracy, which is shown here to be a stringent requirement. As examples, first applications are made to SiII lines in a solar prominence and to some high-resolution observations of the solar HeII 303.78-Å resonance line.

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