High-precision MTF measurement instrument for focal plane arrays with on-chip TDI

Computer Science – Performance

Scientific paper

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Analog Data, Chips (Electronics), Focal Plane Devices, Infrared Imagery, Signal Processing, Modulation Transfer Function, Performance Tests

Scientific paper

The development of focal plane arrays with considerable on-chip processing, notably time-delayed integration, imposes new and severe requirements on the instrumentation to establish the modulation transfer function (MTF) of the integrated focal plane array. This paper describes an instrument to obtain the MTF for such arrays with a high level of accuracy. This instrument was built, and associated errors were obtained experimentally. The instrument uses sine-wave amplitude modulation across the spatial frequency spectrum to reach the Nyquist frequency of the focal plane array. Various algorithms to derive the MTF from the experimental data were investigated; the preferred approach is presented.

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