Reflectance microspectroscopy of natural rock samples in the visible and short-wave infrared

Details Reflectance microspectroscopy of natural rock samples in the visible and short-wave infrared Reflectance microspectroscopy of natural rock samples in the visible and short-wave infrared

Dec 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007agufm.p21a0211m&link_type=abstract

American Geophysical Union, Fall Meeting 2007, abstract #P21A-0211

Other

5400 Planetary Sciences: Solid Surface Planets, 5464 Remote Sensing, 5494 Instruments And Techniques, 6225 Mars

Scientific paper

We have collected reflectance spectra of various rock samples in the 450-1650 nm wavelength range with a spatial resolution of 50 and 100 micrometers and we have compared three microscopic modalities, confocal, bright-field, and dark-field. High contrast spectra that are comparable to those obtained from macroscopic measurements have been obtained in dark field mode from rough, unprepared samples of jarosite, alunite, olivine, gibbsite, and other minerals and test targets. The scale of roughness of the samples is consistent with that obtained from a typical Mars rover rock abrasion tool. Spectral discrimination and spatial resolution are demonstrated at the sharp boundaries between two different minerals. The confocal and bright field modes are shown to suffer from previously known potential artifacts, but the usefulness of the confocal mode in establishing optimum focus automatically remains. These results support the conclusion that reflectance microspectroscopy in the visible to short-wave infrared can be a valuable tool for understanding mineral formation at the spatial scale of tens of micrometers and is suitable for unsupervised operation on the Martian surface.

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