Computer Science
Scientific paper
Jul 2000
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000spie.4027..155m&link_type=abstract
Proc. SPIE Vol. 4027, p. 155-162, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, Robert Lee Murrer; Ed
Computer Science
Scientific paper
Comptek Amherst Systems has been involved in the development of a Universal Programmable Interface (UPI) for use in hardware-in-the-loop (HWIL) testing of infrared/electro-optic (IR/EO) sensor systems. The UPI provides an interface between a scene generation system (SGS) and the unit under test (UUT) for either direct injection or optical projection. Unlike custom interfaces, the reconfigurable UPI supports a wide range of sensor systems. It was designed to simulate various sensor effects, emulate bypassed sensor components, and reformat the data for input to the UUT. This paper discusses the advances we have made in the past year on the UPI, including those in both hardware and software.
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