Reliable estimate of photoelectric measurement accuracy

Details Reliable estimate of photoelectric measurement accuracy Reliable estimate of photoelectric measurement accuracy

Apr 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993azh....70..426k&link_type=abstract

Astronomicheskij Zhurnal (ISSN 0004-6299), vol. 70, no. 2, p. 426-429.

Mathematics

Probability

1

Astronomical Photometry, Electrophotometry, Root-Mean-Square Errors, Correlation Coefficients, Probability Distribution Functions

Scientific paper

It is shown that the microexposition method makes it possible to obtain a valid estimate of the accuracy of determining the mean flux during photon-counting photoelectric measurements. This method consists of replacing one or several lengthy (1-10 s) accumulations with a large number of successive short (1-20 ms) expositions with a simultaneous statistical analysis of the obtained data sequence. Atmospheric scintillations strongly affect estimates of the accuracy of the mean and the accuracy of estimates of the dispersion of the sequence and its mean. The accuracy of these estimates increases monotonically with decreasing microexposition, while the overall measuring time is maintained.

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