Contamination analyses of technology mirror assembly optical surfaces

Details Contamination analyses of technology mirror assembly optical surfaces Contamination analyses of technology mirror assembly optical surfaces

Sep 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991catm.rept.....g&link_type=abstract

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Astronomy and Astrophysics

Astrophysics

Contamination, Electron Probes, Mirrors, Optical Properties, Particles, X Ray Astrophysics Facility, X Ray Telescopes, Sampling, Space Stations, Spacecraft Instruments

Scientific paper

Automated electron microprobe analyses were performed on tape lift samples from the Technology Mirror Assembly (TMA) optical surfaces. Details of the analyses are given, and the contamination of the mirror surfaces is discussed. Based on the automated analyses of the tape lifts from the TMA surfaces and the control blank, we can conclude that the particles identified on the actual samples were not a result of contamination due to the handling or sampling process itself and that the particles reflect the actual contamination on the surface of the mirror.

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