TOF-SIMS analysis of interplanetary dust

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Cosmic Rays, Interplanetary Dust, Mass Spectroscopy, Stratosphere, Electron Diffraction, Electron Probes, Epoxy Compounds, Mass Spectra, Mass Spectrometers, Time Of Flight Spectrometers

Scientific paper

Three interplanetary dust particles (IDPs) collected in the stratosphere were analyzed with imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) to investigate the elemental distribution within these particles at high lateral resolution and to demonstrate the abilities of this new technique for the analysis of IDPs and other microsamples. This study should furthermore show that it is possible to correlate TOF-SIMS data and TEM observations of the same interplanetary dust particle. Element ratios for 15 different elements relative to Si were determined using SIMS sensitivities from analyses of serveral standards. The TOF-SIMS results show inhomogeneous distribution and large deviations from chondritic abundances for several elements in IDP U2015G1 whereas W7029*A27 and L2005P9 show chondritic element ratios and a relatively homogeneous distribution, respectively. These results, which are comparable with previous results obtained by different techniques, demonstrate the reliability of TOF-SIMS, even for quantitative measurements. In U2015G1 halogen and sulphur enrichments were observed in an extremely fine-grained Fe oxide phase. This can easily be explained by contamination processes in the stratosphere.

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