STIS CCD Performance Monitor

Details STIS CCD Performance Monitor STIS CCD Performance Monitor

Jul 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008hst..prop11843w&link_type=abstract

HST Proposal ID #11843. Cycle 17

Computer Science

Performance

Scientific paper

This activity measures the baseline performance and commandability of the CCD subsystem. Only primary amplifier D is used. Bias and Flat Field exposures are taken in order to measure bias level, read noise, CTE, and gain. Numerous bias frames are taken to permit construction of "superbias" frames in which the effects of read noise have been rendered negligible. Full frame and binned observations are made, with binning factors of 2 x 1, 1 x 2, 2 x 2. Bias frames are taken in subarray readouts to check the bias level for ACQ and ACQ/PEAK observations. All exposures are internals.;

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