NICMOS DC Transfer Function Test

Details NICMOS DC Transfer Function Test NICMOS DC Transfer Function Test

Jul 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008hst..prop11406s&link_type=abstract

HST Proposal ID #11406. Cycle 17

Computer Science

Scientific paper

This early activity following the re-activation and re-cooling of NICMOS following SM4 is designed to test the basic operability of the NICMOS HgCdTe photodiode array focal plane detectors without exposure to external stimulating irradiation. This test requires "special commanding" and "non-standard" instrument state transition scheduling This test is to be executed following NCS cool-down and equilibration of the NICMOS detectors at their anticipated nominal Cycle 17 operating temperatures. Detector operability and dark functionality will be assessed from executing a bias-voltage ramped series series non-stimulated {dark} multiple non-destructive readout exposures; with the detector bias voltages ramped in 0.1V commanded steps from zero volts DC to 0.6 volts DC. These data MUST be taken in parallel in all three cameras, and make use of "non- standard" multi-accum sample-sequences, as we will compare these results directly to multiple pre-launch runs of the NICMOS System Test as well as the execution of SM2/NIC 7037 and SM3B/8976.;

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