Normal incidence spectrophotometer with high-density transmission grating technology and high-efficiency silicon photodiodes for absolute solar extreme-ultraviolet irradiance measuremen

Details Normal incidence spectrophotometer with high-density transmission grating technology and high-efficiency silicon photodiodes for absolute solar extreme-ultraviolet irradiance measuremen Normal incidence spectrophotometer with high-density transmission grating technology and high-efficiency silicon photodiodes for absolute solar extreme-ultraviolet irradiance measuremen

Dec 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993opten..32.3121o&link_type=abstract

Optical Engineering 32(12), 3121-3125, Brian J. Thompson; Ed.

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12

Scientific paper

New developments in transmission grating and photodiode technology now make it possible to realize spectrometers in the extreme ultraviolet (EUV) spectral region ((lambda) equals 1000 angstroms), which are expected to be virtually constant in their diffraction and detector properties. Time-dependent effects associated with reflection gratings are eliminated through the use of free- standing transmission gratings. These gratings together with recently developed and highly stable EUV photodiodes have been utilized to construct a highly stable normal incidence spectrophotometer to monitor the variability and absolute intensity of the solar 304 angstroms line. Owing to its low weight and compactness, such a spectrometer will be a valuable tool for providing absolute solar irradiance throughout the EUV. This novel instrument will also be useful for cross-calibrating other EUV flight instruments and will be flown on a series of Hitchhiker shuttle flights and on SOHO. A preliminary version of this instrument has been fabricated and characterized, and the results are described.

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