Measured Stark width and shift of 220.798 nm neutral silicon spectral line.

Details Measured Stark width and shift of 220.798 nm neutral silicon spectral line. Measured Stark width and shift of 220.798 nm neutral silicon spectral line.

Sep 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997pobeo..57..117s&link_type=abstract

Publications of the Astronical Observatory of Belgrade, No. 57, p. 117 - 119

Astronomy and Astrophysics

Astronomy

Spectral Lines: Stark Broadening, Spectral Lines: Silicon

Scientific paper

Stark width and shift of the 220.798 nm Si I line was measured at a
28500K electron temperature and a
1.9×1023m-3 electron density in a linear,
low-pressure, pulsed arc operated in an argon-helium mixture.

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