Determination of K, Ar, Cl, S, Si and Al flare abundances from RESIK soft X-ray spectra

Details Determination of K, Ar, Cl, S, Si and Al flare abundances from RESIK soft X-ray spectra Determination of K, Ar, Cl, S, Si and Al flare abundances from RESIK soft X-ray spectra

Sep 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008adspr..42..838s&link_type=abstract

Advances in Space Research, Volume 42, Issue 5, p. 838-843.

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Scientific paper

The RESIK is a high sensitivity, uncollimated bent crystal spectrometer which successfully operated aboard Russian CORONAS-F solar mission between 2001 and 2003. It measured for the first time in a systematic way solar soft X-ray spectra in the four wavelength channels from 3.3 Å to 6.1 Å. This range includes characteristic strong lines of H- and He-like ions of K, Ar, Cl, Si, S and Al in the respective spectral channels. A distinguishing feature of RESIK is its possibility of making reliable measurements of the continuum radiation in flares. Interpretation of line and the continuum intensities observed in vicinity of respective strong lines provides diagnostics of plasma temperature and absolute abundances of K, Ar, Cl, S, Si and Al in several flares. We analyzed the observed intensities of spectral lines and the nearby continuum using the CHIANTI v5.2 atomic data package. A specific, so-called “locally isothermal” approach has been used in this respect allowing us to make not only flare-averaged abundance estimates, but also to look into a possible variability of plasma composition during the course of flares.

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