Stray radiation in optical systems II; Proceedings of the Meeting, San Diego, CA, July 20-22, 1992

Details Stray radiation in optical systems II; Proceedings of the Meeting, San Diego, CA, July 20-22, 1992 Stray radiation in optical systems II; Proceedings of the Meeting, San Diego, CA, July 20-22, 1992

Feb 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993spie.1753.....b&link_type=abstract

Stray radiation in optical systems II; Proceedings of the Meeting, San Diego, CA, July 20-22, 1992 Society of Photo-Optical Inst

Astronomy and Astrophysics

Astronomy

Background Radiation, Conferences, Optical Measuring Instruments, Beryllium, Cost Reduction, Far Infrared Radiation, Jet Engines, Metal Coatings, Metal Surfaces, Mirrors, Reflectance, Silicon Carbides, Sky Surveys (Astronomy), Spatial Filtering, Structural Weight, Surface Roughness, Vapor Deposition, Zinc Selenides

Scientific paper

Various papers on stray radiation in optical systems are presented. Individual topics discussed include: ultralightweight beryllium mirror development; imaging incoherent, off-axis, scattered radiation; correcting for diffraction in the FIR reflectance measurement of rough surfaces; effect of jet-engine exhaust on SOFIA stray-light performance; specular baffles; wavelength dependence of scatter in chemical-vapor-deposited SiC; selection processes for black baffle surfaces in optical systems; PEARLSS model for contamination effects; black surfaces for space and ground-based optical systems; very near specular measurement via incident angle scaling. Also discussed are: near-specular measurements of integrated scatter; thermal emissivity analysis of a Gemini 8-m telescope design; design and on-orbit performance in the WIND II baffle system; knife-edged diffuse-absorptive and dual reflective baffles; stray-light analysis of the Cassini telescope; use of Siamese pseudoptics in APART; bidirectional reflectance data to support paint development and signature calculations; rugged dark materials for stray-light suppression by seeded ion beam texturing; Mueller matrix measurement of scattered light; unique out-of-plane polarimetric scatterometer.

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