Analysis of the Radiation Environment Effects on Electronic Components in Near-Earth Orbits

Details Analysis of the Radiation Environment Effects on Electronic Components in Near-Earth Orbits Analysis of the Radiation Environment Effects on Electronic Components in Near-Earth Orbits

Feb 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001stin...0126346v&link_type=abstract

Technical Report, AD-A385577; DREO-TM-2000-071

Computer Science

Earth Orbits, Artificial Satellites, Radiation Shielding, Radiation Effects, Solar Activity, Monte Carlo Method, Environment Models, Electronic Equipment, Aerospace Environments, Radiation Dosage, Radiation Belts, Aluminum, Silicon, Component Reliability

Scientific paper

The radiation environments at two low altitude orbits have been calculated with the NASA space environment models and codes AP8/AE8, Vette, and CREME. LET spectra and device upset rates for various solar activity scenarios have been determined. Dose deposition into silicon targets as a function of Aluminum shielding thickness has been also calculated with a Monte Carlo code. The results indicate that parameters such as orbit altitude, shielding thickness, and solar activity strongly affect the SEU rates.

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