STIS-01 CCD Functional

Details STIS-01 CCD Functional STIS-01 CCD Functional

Jul 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001hst..prop.8957v&link_type=abstract

HST Proposal ID #8957

Computer Science

Performance

Hst Proposal Id #8957

Scientific paper

This activity measures the baseline performance and commandability of the CCD subsystem. Only primary amplifier D is used. Bias, Dark, and Flat Field exposures are taken in order to measure read noise, dark current, CTE, and gain. Numerous bias frames are taken to permit construction of "superbias" frames in which the effects of read noise have been rendered negligible. Dark exposures are made outside the SAA. Full frame and binned observations are made, with binning factors of 1x1 and 2x2. Finally, tungsten lamp exposures are taken through narrow slits to confirm the slit positions in the current database. All exposures are internals. This is a reincarnation of SM3A proposal 8502 with some unnecessary tests removed from the program.

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