Responsivity model for a silicon photodiode in the extreme ultraviolet

Details Responsivity model for a silicon photodiode in the extreme ultraviolet Responsivity model for a silicon photodiode in the extreme ultraviolet

Dec 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000spie.4139....1s&link_type=abstract

Proc. SPIE Vol. 4139, p. 1-7, Instrumentation for UV/EUV Astronomy and Solar Missions, Silvano Fineschi; Clarence M. Korendyke;

Astronomy and Astrophysics

Astronomy

Scientific paper

A silicon photodiode detector, type AXUV-100G, was modeled by calculating the electromagnetic field strength in each region of the photodiode. The reflectance and transmittance at each boundary and the absorption of energy in each region of the device were calculated. By using an empirical carrier collection efficiency in each region, the calculated responsivity was in agreement with the experimental responsivity in the 1 nm to 25 nm wavelength range. In the 2.7 nm to 80 nm wavelength range, the model was used to simulate the experimentally observed decrease in responsivity of a photodiode that had undergone radiation damage.

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