Astronomy and Astrophysics – Astronomy
Scientific paper
Oct 1996
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2808..313e&link_type=abstract
Proc. SPIE Vol. 2808, p. 313-324, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, Oswald H. Siegmund; Mark A. Gummi
Astronomy and Astrophysics
Astronomy
Scientific paper
On future astronomical instruments for the soft x-ray to FUV, stray light may be a significant cause of background events. Currently, we are engaged in an ongoing program to identify materials that are suitable for use as low- reflectance surfaces in space based instruments. As a result, we have measured the scattering performance in this spectral region, of wide a selection of low-reflectivity materials, produced with a range of processes. We present preliminary measurements of the absolute bidirectional reflectance distribution function (BRDF) for a selection of seven of these materials. Measurements were obtained at a five spectral lines, including strong geocoronal lines, over the wavelength range 44 to 1216 angstrom at near grazing incidence. We find that in most cases for constant incident and scatter angles, the total variation of BRDF with wavelength over this range is only a factor of order ten. We also find that although we have identified materials which in many instances have lower reflectances than bead blasted aluminum, it is still a good choice for most applications given its low cost and convenience.
Cully Scott L.
Edgar Michael L.
Jelinsky Patrick N.
Jelinsky Sharon R.
Siegmund Oswald H.
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