Improved Atomic Models for EUV Imaging Instruments

Details Improved Atomic Models for EUV Imaging Instruments Improved Atomic Models for EUV Imaging Instruments

May 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009spd....40.1506y&link_type=abstract

American Astronomical Society, SPD meeting #40, #15.06; Bulletin of the American Astronomical Society, Vol. 41, p.836

Astronomy and Astrophysics

Astronomy

Scientific paper

A combination of new atomic data and new line identifications made from Hinode/EIS spectra have expanded and improved atomic models for Fe VII and Fe IX emission lines in the extreme ultraviolet wavelength range. These have a significant effect on the response functions of EUV imaging instruments, particularly the 195 angstrom filters used by SOHO/EIT, TRACE, STEREO/EUVI and SDO/AIA, and will be discussed.

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