Chemical Imaging of Nakhlite Secondary Mineralization at the Sub-Micrometer Length Scale: A TOF-SIMS Study

Details Chemical Imaging of Nakhlite Secondary Mineralization at the Sub-Micrometer Length Scale: A TOF-SIMS Study Chemical Imaging of Nakhlite Secondary Mineralization at the Sub-Micrometer Length Scale: A TOF-SIMS Study

Mar 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001lpi....32.2105v&link_type=abstract

32nd Annual Lunar and Planetary Science Conference, March 12-16, 2001, Houston, Texas, abstract no.2105

Computer Science

Scientific paper

This study represents a detailed in situ examination of Nakhlite
alteration by way of high spatial resolution secondary ion mass
spectroscopy. Full mass spectrum TOF-SIMS imaging results of hydrous
veinlets from both Nakhla and Lafayette are compared.

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