Using very high resolution data to assess the limitations of polarimetric interferometry for height measurement

Details Using very high resolution data to assess the limitations of polarimetric interferometry for height measurement Using very high resolution data to assess the limitations of polarimetric interferometry for height measurement

Jan 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002esasp.475..261g&link_type=abstract

In: Proceedings of the Third International Symposium on Retrieval of Bio- and Geophysical Parameters from SAR Data for Land Appl

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Agriculture, Land Cover

Scientific paper

Very high resolution polarimetric measurements of man-made and natural targets within the University of Sheffield GB-SAR indoor Ground-based Microwave Facility allow us to investigate the basic processes in polarimetric interferometry. The target comprised two layers of nails, one with the nails predominantly vertical and the other predominantly horizontal, which were embedded in expanded polystyrene. These two layers were then placed one above the other with a vertical separation of 15 cm, and were imaged by the GB-SAR system at X band. Very successful interferometric height measurements of the separation of the two layers were possible using a priori knowledge about the scattering properties of the two layers. Using coherence optimisation techniques, the height recovery showed bi-modality, with peaks separated by the inter-layer height difference. Simulations indicated instabilities in the coherence optimisation technique for targets comprised purely of orthogonal scattering mechanisms.

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