Computer Science
Scientific paper
Jul 1993
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993metic..28q.355g&link_type=abstract
Meteoritics, vol. 28, no. 3, volume 28, page 355
Computer Science
2
Chondrules, Iodine, Ion Probe, Silicates, Sulphides
Scientific paper
Isotopic studies of electronegative elements (e.g. H, C, O, S, I, etc.) by the ion microprobe is best done in the negative secondary mode as the negative ion yields for these elements are much higher compared to their positive ion yields. However, analysis of non-conducting solids (e.g., silicates) in the negative secondary mode is beset with the problem of sample charging. In addition, for heavy elements like iodine, the problem of molecular interferences is also difficult to resolve. We have used a normal incidence electron gun, that generates a cloud of low energy electron near the sample surface, to overcome the problem of sample charging. The problem of molecular interferences was effectively removed by the energy filtering technique, commonly used for trace element studies [1]. Since the normal energy filtering procedure that involves introduction of appropriate offset to the sample high voltage cannot be followed in the negative secondary mode, we have introduced offset to the electrostatic analyzer (ESA) voltage, to achieve the required energy filtering. A silicon sample was analyzed to calibrate ESA voltage offset with sample voltage offset. We have initially analyzed silicon samples and a set of silicate glasses doped with iodine (0.1 to 1.5% by weight) to check for optimum conditions for measurement of low iodine concentration (
Goswami Jitendra N.
Grossman Jeffrey N.
Musselwhite Donald Stanley
Sahijpal Sandeep
Swindle Timothy D.
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