XM-1: the high-resolution soft x-ray microscope at the Advanced Light Source

Details XM-1: the high-resolution soft x-ray microscope at the Advanced Light Source XM-1: the high-resolution soft x-ray microscope at the Advanced Light Source

Nov 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000spie.4146...54p&link_type=abstract

Proc. SPIE Vol. 4146, p. 54-59, Soft X-Ray and EUV Imaging Systems, Winfried M. Kaiser; Richard H. Stulen; Eds.

Computer Science

1

Scientific paper

The XM-1 soft x-ray microscope utilizes bending-magnet radiation from the Advanced Light Source in Berkeley, CA. This radiation is collected by a `large' (9 mm diameter) fresnel condenser zone plate which projects light through a pinhole and illuminates the sample. The radiation transmitted through the sample is then focused and magnified by a high-precision objective micro zone plate and recorded by a soft x-ray CCD camera. Our condenser zone plate and pinhole combination serves ad our adjustable monochromator for selecting the desired photon energy, giving us a (lambda) /(Delta) (lambda) of 700. This moderate spectral resolution allows for spectroscopic imaging with XM-1, including samples of magnetic materials with contrast provided by magnetic circular dichroism. Our user-friendly software programs allow for frequent utilization of complex image processing techniques.

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