Computer Science
Scientific paper
Nov 1994
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2283..202z&link_type=abstract
Proc. SPIE Vol. 2283, p. 202-213, X-Ray and Ultraviolet Spectroscopy and Polarimetry, Silvano Fineschi; Ed.
Computer Science
Scientific paper
Chemical elements are characterized by the nature of the interaction between their electrons and incoming photons. The uniqueness of a spectral signature of each chemical element is used in spectroscopy for element detection and characterization. We report the design of the detection and chemical composition analysis system, TOMOSCOP, which is based on tomographic spectroscopic imaging at x-ray energies within the 15 - 30 keV range. The detection of the presence of an element or a group of elements and measurements of their concentration in a sample are based on calibration attenuation measurements conducted on known samples. The TOMOSCOP system utilizes x-ray filter spectroscopy for positive identification and concentration measurement of an element within a sample. Tomography combined with spectroscopy provides the unique detection capability of the TOMOSCOP system in which elements and compounds (substances) present within the test volume are localized and detected.
Fennelly Alphonsus J.
Fry Edward L.
Torr Douglas G.
Wilson Michele M.
Zukic Muamer
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