X-ray performance of the engineering prototype Stellar X-Ray Polarimeter

Computer Science – Performance

Scientific paper

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Scientific paper

The performance of the engineering prototype Stellar X-Ray Polarimeter (SXRP) has been evaluated. One hundred percent polarized monochromatic x rays at 2.6 keV and 9.7 keV were used to measure the response of the instrument in the energy bands of the graphite and lithium polarizing elements, respectively. On-line analysis showed that the respective depths of modulation are 96% ad 70% as expected. Irradiating SXRP with broadband unpolarized x rays in the energy band 2 - 17 keV demonstrated that the level of spurious modulation inherent in the instrument is less than 3%. Up-to-date results are presented and compared to the predictions of Monte Carlo simulations.

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