Woelter x ray microscope characterization measurements on Nova

Details Woelter x ray microscope characterization measurements on Nova Woelter x ray microscope characterization measurements on Nova

Apr 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992htpd.conft..15r&link_type=abstract

Presented at the 9th Topical Conference on High-Temperature Plasma Diagnostics, Santa Fe, NM, 15-19 Mar. 1992

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Applications

Microscopes, Microscopy, Particle Accelerator Targets, Plasma Diagnostics, X Ray Analysis, X Ray Apparatus, Characterization, Laser Applications, Spatial Resolution, Streak Cameras

Scientific paper

We have made in situ measurements of the spatial resolution function for
two sectors of the 22X magnification Woelter x-ray microscope. Our
experimental technique using backlit grid shot on the Nova laser and our
method of analysis are described.

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